Polymers near the surface or interface exhibit different conformation compared with those in the bulk, and consequently different physical properties. We are interested in the deviations of these morphology and properties when polymers are confined in thin film geometry. We are studying this from a new approach by incorporating polymer thin films in OFET devices as the dielectric or active layer, and then link optoelectronic responses of these devices with physical properties of the polymer thin films. We probe the local information of polymers at different depth of a thin film (of nanometer thickness) using grazing incidence synchrotron X-ray scattering.
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